|
• 3D OPTICAL METROLOGY • NON DESTRUCTIVE INSPECTION |
cyberTECHNOLOGIES is a leading global supplier of standalone and integrated high resolution Profile and 3D Optical Metrology Systems for non-destructive process control of surface topography, dimensional metrology, shape, film thickness and quality inspection of Integrated Devices, Si, GaAs & Glass Wafers, MEMS, Solar Cells, Fuel Cells, Lenses, Printed Products, Chip Packages, any type of engineered surfaces and many other devices. Our easy to use and comprehensive software provides increased operational efficiencies in measuring single samples in the lab as well as large batches automatically in production. |
CT 300 High resolution non-contact surface measurement system |
